Author(s): Palakben K. Parikh, Julee P. Soni, Ravi N. Patel, Urviben Y. Patel, Kaumil N. Modi, Hiren M. Marvaniya, Dhrubo Jyoti Sen

Email(s): dhrubosen69@yahoo.com

DOI: Not Available

Address: Palakben K. Parikh, Julee P. Soni, Ravi N. Patel, Urviben Y. Patel, Kaumil N. Modi, Hiren M. Marvaniya and Dhrubo Jyoti Sen
Department of Pharmaceutical Chemistry, Shri Sarvajanik Pharmacy College, Gujarat Technological University, Arvind Baug, Mehsana-384001, Gujarat,
*Corresponding Author:

Published In:   Volume - 2,      Issue - 6,     Year - 2010


ABSTRACT:
Modern wired generation has a serious hobby in webhunting through net-surfing cum browsing. Huge data collection on various topics and further re-formatting to present in desired platform is a new style between new generations to old generation generates the coinage malpractice of plagiarism. Strategies of Select-Copy-Paste are the three muskatieers to build a new entity which is an assembled chapter on new pages of presentable format of new article engineered by manipulated fabrication under the umbrella of malpractice. Some detectors have been launched to control over this malpractice by latest software.


Cite this article:
Palakben K. Parikh, Julee P. Soni, Ravi N. Patel, Urviben Y. Patel, Kaumil N. Modi, Hiren M. Marvaniya, Dhrubo Jyoti Sen. Plagiarism: A Serious Malpractice in Latest Infrastructure through Webhunting. Research J. Science and Tech. 2010; 2(6): 134-144.

Cite(Electronic):
Palakben K. Parikh, Julee P. Soni, Ravi N. Patel, Urviben Y. Patel, Kaumil N. Modi, Hiren M. Marvaniya, Dhrubo Jyoti Sen. Plagiarism: A Serious Malpractice in Latest Infrastructure through Webhunting. Research J. Science and Tech. 2010; 2(6): 134-144.   Available on: https://rjstonline.com/AbstractView.aspx?PID=2010-2-6-3


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Author(s): Palakben K. Parikh, Julee P. Soni, Ravi N. Patel, Urviben Y. Patel, Kaumil N. Modi, Hiren M. Marvaniya, Dhrubo Jyoti Sen

DOI:         Access: Open Access Read More

Research Journal of Science and Technology (RJST) is an international, peer-reviewed journal, devoted to science and technology...... Read more >>>

RNI: Not Available                     
DOI: 10.5958/2349-2988 


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